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BS EN 12409-2008+A1-2011 塑料和橡胶机械.加热成形机.安全要求

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【英文标准名称】:Plasticsandrubbermachines.Thermoformingmachines.Safetyrequirements
【原文标准名称】:塑料和橡胶机械.加热成形机.安全要求
【标准号】:BSEN12409-2008+A1-2011
【标准状态】:现行
【国别】:英国
【发布日期】:2008-10-31
【实施或试行日期】:2008-10-31
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:Accidentprevention;Breathing;Contact;Contactsafetydevices;Control;Dangerzones;Definitions;Design;Drawing-in;Electriccontactprotection;Electricenergy;Electricshock;Electricalequipment;Electricalsafety;Energysupplysystems(buildings);Gases;Hazards;Healthandsafetyrequirements;Hearing(auditoryperception);Hot-working;Impact;Machinetools;Machines;Mechanicalcrimping;Mechanicalengineering;Moulding(process);Noise;Noise(environmental);Noisereduction;Occupationalsafety;Operatinginstructions;Plasticfilms;Plastics;Plasticsprocessing;Plastics-workingmachinery;Presses;Pressing(forming);Production;Protectiondevices;Protectivemeasures;Rubberindustry;Rubbermachines;Safetydevices;Safetyengineering;Safetymeasures;Safetyofmachinery;Safetyrequirements;Shape;Shearing;Sound;Specification(approval);Stress;Suctionplants;Surfacetemperatures;Temperature;Testing;Thermoformingmachine;Userinformation;Vapours;Vulcanizedrubber;Workplacesafety
【摘要】:
【中国标准分类号】:G95
【国际标准分类号】:83_200
【页数】:52P;A4
【正文语种】:英语


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【英文标准名称】:StandardTestMethodsforRatingandClassifyingInclusionsinSteelUsingtheScanningElectronMicroscope
【原文标准名称】:用扫描电子显微镜分级和分类铁中内含物的标准试验方法
【标准号】:ASTME2142-2008
【标准状态】:现行
【国别】:美国
【发布日期】:2008
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E04.11
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:
【英文主题词】:automaticimageanalysis;complexinclusions;EDX;globularinclusions;inclusions;inclusionratings;inclusionstringers;oxides;second-phaseparticles;SEM;steel;stereology;sulfides;X-Raymicroanalysis;Automatedprocedures--metals/al
【摘要】:ThistestmethodisestablishedtocoverautomatedSEM/EDX-basedproceduresfor:RatingtheinclusioncontentofsteelsbasedonprocedureslistedinStandardsE45andE1245,withthesignificantdifferencethatthecompositionoftheindividualinclusions,asdeterminedbyX-rayanalysis,isutilizedtosortthemintochemicalclasses.Determiningthenumber,sizeandmorphologicaldistributionofinclusionsinsteelssortedbychemicalclass.Methods1and2ofthistestmethodareprimarilyintendedforratingtheinclusioncontentofsteelsdeoxidizedwithsiliconoraluminum,bothsiliconandaluminum,orvacuum-treatedsteelswithouteithersiliconoraluminumadditions.Guidelinesareprovidedtorateinclusionsinsteeltreatedwithrareearthadditionsorcalcium-bearingcompounds(13.4).Whensuchsteelsareevaluated,thetestreportshoulddescribethenatureoftheinclusionsratedaccordingtoeachinclusioncategory(A,B,C,D).Methods1and2willprovideaquantitativeratingoftheinclusioncontentinhalf-severitynumberincrementsfrom0to5foreachinclusiontypeandthickness(MethodDofTestMethodE45),andintabulatedinTable2.TestMethodE45ratingsbySEMmaydifferfromthosedeterminedfollowingE45becauseoftheuseofchemistryintheclassifications.InordertodifferentiateE45ratingsobtainedusingtheSEMfromtraditionalratingsusinglightmicroscopy,theratingsobtainedusingMethod1or2ofthisTestMethodshallbeidentifiedasE45-SEM1andE45-SEM2,respectively.Method3definesprocedurestoanalyzeandreportinclusionsbyarbitrarysizedistributionandchemicalclassifications.Itmaybemadeapplicabletoanymaterialbyappropriatechoiceoftheseclassifications.Method3determinesandreportsbasic(asusedinTestMethodE1245)stereologicalmeasurements(forexample,volumefractionofsulfidesandoxides,thenumberofsulfidesoroxidespersquaremillimeter,andsoforth).Thistestmethod,however,doesnotaddressthemeasurementofsuchparameters.E45ratingsarenotproducedinMethod3becausetheinclusionclassificationsdonotfollowthosedefinedinTestMethodE45.Thequantitativeresultsareintendedtoprovideadescriptionofthetypesandamountsofinclusionsinaheatofsteel.Thistestmethodcontainsnoguidelinesforsuchuse.TABLE2MinimumValuesforInclusionSeverityRatingLevelsforMeasurementsinMicrometers(Forexpressioninotherunits,seeTestMethodsE45,Table2)TestMethodE45RatingLimits(x03BC;mat1x00D7;orcount)SeverityABCD0.5
37.0
17.2
17.8
1
1.0
127.0
76.8
75.6
2
1.5
261.0
184.2
【英文标准名称】:Discretesemiconductordevicesandintegratedcircuits-Part5-2:Optoelectronicdevices-Essentialratingsandcharacteristics
【原文标准名称】:半导体分立器件和集成电路第5-2部分:光电子器件基本额定值和特性
【标准号】:IEC60747-5-2-1997
【标准状态】:作废
【国别】:国际
【发布日期】:1997-09
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/SC47C
【标准类型】:()
【标准水平】:()
【中文主题词】:额定值;集成电路;光耦合器;极限(数学);光电二极管;光电子器件;显示装置;电子设备及元件;光电晶体管;分立器件;半导体器件;二极管
【英文主题词】:Diodes;Discretedevices;Displaydevices;Electronicequipmentandcomponents;Integratedcircuits;Limits(mathematics);Optoelectronicdevices;Photocouplers;Photodiodes;Phototransistors;Ratings;Semiconductordevices
【摘要】:ThispartofIEC60747givestheessentialratingsandcharacteristicsofthefollowingcategoriesorsubcategoriesofoptoelectronicdeviceswhicharenotintendedtobeusedinthefieldoffibreopticsystemsorsubsystems:-Semiconductorphotoemitters,including:.light-emittingdiodes(LEDs);.infrared-emittingdiodes(IREDs);.laserdiodes.-Semiconductorphotoelectricdetectors,including:.photodiodes;.phototransistors.-Semiconductorphotosensitivedevices.-Semiconductordevicesutilizingtheopticalradiationforinternaloperation,including:.photocouplers,optocouplers.
【中国标准分类号】:L50
【国际标准分类号】:31_260
【页数】:51P.;A4
【正文语种】:英语